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Low-Noise DC-DC Converter Test with an LNA

An LNA test demonstrates how power-supply noise can affect the output spectrum of a sensitive RF circuit.

Measurement Signal Conditioning
Spectrum-analyser measurement from the low-noise power-supply LNA test
LNA output-spectrum measurement during the DC-DC converter comparison.
Article Engineering Update E-REON B.V.

Following questions about power-supply-related performance degradation in sensitive RF circuits, E-REON carried out a direct comparison using an LNA.

Test arrangement

The experiment compared a general-purpose DC-DC converter marketed for low-noise operation with an E-REON converter designed specifically for noise-sensitive RF circuits.

Both converters were supplied from 26 V and used to power the same LNA. The LNA was driven with a −50 dBm continuous-wave carrier while its output spectrum was monitored. Neither converter used a linear post-regulator during the comparison.

The test illustrates how the choice of power supply can influence the received spectrum in a low-noise amplifier stage. A subsequent evaluation was planned to examine phase-noise and spurious-performance degradation in a phase-locked loop.